Ugrás a tartalomhoz

 

Towards Automated Worst-Case Analysis of Circuits: Selecting Initial Values for Global Optimization

  • Metaadatok
Tartalom: http://hdl.handle.net/10890/40944
Archívum: Műegyetem Digitális Archívum
Gyűjtemény: 1. Tudományos közlemények, publikációk
Konferenciák gyűjteményei
BME MIT PhD Minisymposium
BME MIT PhD Minisymposium, 2023, 30th
Cím:
Towards Automated Worst-Case Analysis of Circuits: Selecting Initial Values for Global Optimization
Létrehozó:
Horváth, Kristóf
Bank, Balázs
Orosz, György
Dátum:
2023-04-24T07:25:25Z
2023-04-24T07:25:25Z
2023
Tartalmi leírás:
Worst-case circuit analysis is a mandatory practice in hardware verification and validation. To this end, several methods, including extreme value analysis (EVA) and Monte Carlo analysis are commonly used, however, each has its own limitations. Numerical optimization-based methods have the potential to be generally usable, but have the tendency to get stuck in a local minimum, which can be mitigated using carefully chosen initial values. In this paper we propose methods for automated initial value selection for black-box circuit models. The methods are demonstrated to work on several standard test functions, which is a first step in building an automated worst-case circuit analysis tool.
Nyelv:
angol
Típus:
könyvfejezet
Formátum:
application/pdf
Azonosító: