| Tartalom: |
http://hdl.handle.net/10890/60588 |
| Archívum: |
Műegyetem Digitális Archívum |
| Gyűjtemény: |
1. Tudományos közlemények, publikációk
Konferenciák gyűjteményei
BME MIT PhD Minisymposium
BME MIT PhD Minisymposium, 2025, 32nd
|
| Cím: |
Framework for Automated Worst-Case Analysis
|
| Létrehozó: |
Weisz, Pál
Orosz, György
|
| Dátum: |
2025-05-22T11:44:51Z
2025-05-22T11:44:51Z
2025-05-23
|
| Tartalmi leírás: |
In this paper, a framework along with an electronic circuit database is presented. The framework can be used to test advanced worst-case circuit analysis algorithms. It has two main components: a software environment and a circuit database. The software environment is capable of running the circuit simulations and returning the results. The framework also provides a software interface between the circuit simulator and the data processing algorithms by transferring and converting data between different software components. Finally, the simulation results can be post-processed at different levels in time and frequency domains. The heart of the framework is the circuit database. The database is intended to be used as a benchmark and test environment for advanced analysis algorithms. The circuits are collected and categorized to support promising research directions. Such research fields are: automatic decomposition of electrical circuits into independent or loosely coupled subcircuits; extreme value search in the case of complex circuits; identification of characteristic behavior of circuits where the system has different operation modes or some parameter constellations can result in different behavior.
|
| Nyelv: |
angol
|
| Típus: |
könyvfejezet
|
| Formátum: |
application/pdf
|
| Azonosító: |
|
